Laboratory and equipment

Jeol JSM-6460

Environmental Scanning Electron Microscope (SEM) with EDS, WDS and EBSD analysis.

Jeol JSM-6460 booking

Check if the SEM is booked

Google calendar (Only for authorized)

[http://www.google.com/calendar/embed?src=ltu.se_6t8i13ugdts3h7ajrml4bl3o28%40group.calendar.google.com&ctz=UTC]

BAL-TEC RES 010

Ion beam milling system for thinning of TEM samples.

Balzers SCD 050

Sputter for coating of SEM samples.

Philips X´Pert, MRD system

X-ray diffractometer for multiple purposes.

STA 449C

Mass spectrometer

DIL 402

Dilatometer

Page Editor and Contact: Kersti Bergkvist

Published: 22 April 2006

Updated: 25 May 2010

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Luleå University of Technology