Seminar on advanced materials analysis attracted over 70 participants

Luleå University of Technology recently hosted a well-received lunchtime seminar organized by LUMIA, a research initiative that brings together four advanced microanalysis laboratories. The event, which attracted over 70 participants from the research community, industry, and academia, offered insights into advanced techniques for material analysis.

The seminar began with a presentation by Glenn Bark, Associate Professor in Ore Geology and Director of Operations for LUMIA (Luleå Material Imaging and Analysis), who emphasized the importance of collaboration between research and technological advancements in microanalysis.

“This seminar is an opportunity for us to showcase the unique technical capabilities that LUMIA has in microscopy and X-ray tomography, and how we can use these tools to advance research,” said Bark.

By combining advanced equipment and expertise, LUMIA aims to create a foundation for pioneering research in materials science and to expand collaboration with larger laboratories such as MAX IV and the national platform for advanced microscopy, ARTEMI.

Glenn Bark, Senior Lecturer in Ore Geology and Director of LUMIA (Luleå Material Imaging and Analysis)

Participants attended several in-depth lectures presenting some of the most advanced techniques in the field, including Scanning Electron Microscopy (SEM), X-ray Computed Tomography (XCT), and FIB-SEM (Focused Ion Beam-Scanning Electron Microscopy). Mathis Warlo and Fredrik Forsberg, both researchers affiliated with LUMIA, highlighted the benefits and applications of SEM and XCT, while Daniel Jensen from TESCAN provided a detailed insight into the possibilities offered by FIB-SEM technology for high-precision analysis.

FIB-SEM technology is part of Luleå University of Technology’s WISE platforms (Wallenberg Initiative Materials Science for Sustainability), which supports sustainable technologies such as fossil-free steel production, battery manufacturing, and energy storage. In the coming months, LUMIA, which oversees one of these platforms, will expand its operations with two new laboratories: a FIB-SEM lab and a more advanced XCT system. Through the FIB-SEM laboratory, LUMIA collaborates with the Machine Elements research group, which manages the other WISE platform. In this way, the LUMIA and WISE initiatives are integrated, optimizing the university's microanalysis capabilities.

Erik Nilsson, an SEM analysis expert affiliated with LUMIA, commented on the seminar’s structure.

“We wanted this seminar to provide a comprehensive overview of the analytical techniques we offer, and I believe we succeeded in creating a good balance between theory and application,” Nilsson said.

In addition to lectures, the event included a Q&A session where participants had the opportunity to ask questions directly to the experts. The discussions covered topics such as how the techniques can be applied to address challenges in research and industry.

The seminar was part of a series of activities aimed at promoting research collaborations and spreading knowledge about technical innovations in material analysis and microscopy. More seminars are planned on an ongoing basis.

• LUMIA
• WISE