The aim of this award is to encourage researchers to present their research works and attendance at the BINDT annual conferences. It was the presentation on the topic “PHM” that has been recommended, and it has also been advised for submission to the Journal of the British Institute of Non-Destructive Testing.
Madhav Mishra, is received for the Attendance researcher award at ‘‘the thirteen International Conference on Condition Monitoring and Machinery Failure Prevention Technologies'', which was held During 10-12 October, 2016 in Paris- France.
This opportunity helps me to broaden my research skills and motivates me to perform better and strengthen my contribution to the research community. I am very happy about the award; it gives me motivation to work even better way, Says Madhav Mishra.
The conference was organized by The British Institute of Non-Destructive Testing “BINDT."